Gamze Ozogul, Arizona State University; Amy M. Johnson, Arizona State University; Martin Reisslein, Arizona State University; Kirsten R. Butcher, University of Utah
Matthew W. Ohland, Purdue University, West Lafayette; Misty L. Loughry, Georgia Southern University; Richard A. Layton, Rose-Hulman Institute of Technology; Hal R. Pomeranz, Deer Run Associates; Wendy L. Bedwell, University of Central Florida, Institute for Simulation and Training; Rebecca Lyons, University of Central Florida, Institute for Simulation and Training; Daniel Michael Ferguson, Purdue University, West Lafayette; Kyle Heyne, University of Central Florida; Tripp Driskell, University of Central Florida; David J. Woehr, University of North Carolina, Charlotte
Ying Tang, Rowan University; Sachin Shetty, Tennessee State University; Kauser Jahan, Rowan University; S. Keith Hargrove, Tennessee State University; John P. Henry
Yi Guo, Stevens Institute of Technology; Shubo Zhang, Stevens Institute of Technology; Arthur B. Ritter FAIMBE, Stevens Institute of Technology; Hong Man, Stevens Institute of Technology
Santosh Chandana Golagani, University of Texas, San Antonio; Moosa Esfahanian, University of Texas, San Antonio; David Akopian, University of Texas, San Antonio; Can Saygin, University of Texas, San Antonio
Oenardi Lawanto, Utah State University; Angela Minichiello, Utah State University; Talha Naqash, Utah State University; Zain ul Abideen, Utah State University
Cassandra McCall, Utah State University; Stephen Secules, Florida International University; Gabriel Van Dyke, Utah State University; Maimuna Begum Kali, Florida International University; Vanessa Tran, Utah State University
Yen-Lin Han, Seattle University; Kathleen E. Cook, Seattle University; Jennifer A Turns, University of Washington; Gregory Mason P.E., zyBooks, A Wiley Brand; Teodora Rutar Shuman, Seattle University
Larkin Martini, Virginia Polytechnic Institute and State University; Dorian Bobbett, University of Michigan; Jeanne Sanders, University of Michigan; Karin Jensen, University of Michigan; Mark Vincent Huerta, Virginia Polytechnic Institute and State University
Karl D. Schubert FIET, University of Arkansas; Carol S Gattis, University of Arkansas; Xochitl Delgado Solorzano, University of Arkansas; Jennie S Popp Ph.D.; Paul D Adams, University of Arkansas; Leslie Bartsch Massey, University of Arkansas; Thomas Carter III, University of Arkansas; Chunhua Cao, The University of Alabama
Jae Hoon Ma, Georgia Institute of Technology; Ece Erdogmus, Georgia Institute of Technology; Erica Ryherd, University of Nebraska, Lincoln; Heidi A. Diefes-Dux, University of Nebraska, Lincoln; Kyungki Kim, University of Nebraska, Lincoln; Catherine Armwood-Gordon, Tennessee State University
Jelena Trajkovic, California State University, Long Beach ; Lisa M Martin-Hansen, California State University, Long Beach; Anna Bargagliotti, Loyola Marymount University; Christine Alvarado, University of California, San Diego; Cassandra M Guarino, University of California, Riverside; Janel Ancayan, California State University, Long Beach; Joseph Alex Chorbajian, California State University, Long Beach; Kent Vi, California State University, Long Beach
Zechun Cao, Texas A&M University, San Antonio; German Zavala Villafuerte; Ali Jalooli; Renu Balyan; Sanaz Rahimi Moosavi; Francisco Iacobelli, Northeastern Illinois University
Sarah L Rodriguez, Virginia Polytechnic Institute and State University; Taylor Johnson, Virginia Polytechnic Institute and State University; Yeny Jimenez, Miami Dade Community College; antonio delgado
Emmanuella Obiageli Ejichukwu, University of Michigan, Dearborn; DeLean Tolbert Smith, University of Michigan, Dearborn; Hanadi Matar, University of Michigan, Dearborn
Scott Schneider, University of Dayton; Erick S. Vasquez-Guardado, University of Dayton; Corinne H Mowrey, University of Dayton; Michael Moulton, University of Dayton; Homero Murzi, Virginia Polytechnic Institute and State University; Matthew A Witenstein, University of Dayton
Julie Aldridge, The Ohio State University; Nicole Else-Quest, University of North Carolina at Chapel Hill; So Yoon Yoon, University of Cincinnati; Joe Roy, American Society for Engineering Education