Olusola Adesope, Washington State University; Oluwafemi J. Sunday, Washington State University; Ebenezer Rotimi Ewumi, Washington State University; Angela Minichiello P.E., Utah State University; Muhammad Asghar P.E., Utah State University; Candis S. Claiborn, Washington State University
Heather Lee Perkins, North Carolina State University; Justin Charles Major, Purdue University, West Lafayette; Julianna S. Ge, Purdue University, West Lafayette; Matthew Scheidt, Purdue University, West Lafayette; Allison Godwin, Purdue University, West Lafayette
Carmo D'Cruz, Florida Tech; Frank Kinney, Florida Tech; Vaidy Vaidyanathan; Tom O'Neal, University of Central Florida; Clifford Bragdon, Florida Tech; Dennis Kulonda, Florida Tech; Grisselle Centeno, University of South Florida; Jose Zayas-Castro, University of South Florida; Lynda Weatherman, Space Caost EDC
Innovation and Measuring Success in Graduate Education
Collection
2010 Annual Conference & Exposition
Authors
Glenda Scales, Virginia Tech; Shreya Kothaneth, Virginia Polytechnic and State University; Dale Pokorski, Virginia Tech; David Bailey, Virginia Tech; Catherine Amelink, Virginia Tech
Michelle Spence, University of Toronto; Jason A. Foster, University of Toronto; Robert Irish, University of Toronto; Patricia Kristine Sheridan, University of Toronto; Geoffrey Samuel Frost, University of Toronto
Joanna Perry Weaver, University of Louisville; Marci S. DeCaro, University of Louisville; Jeffrey Lloyd Hieb, University of Louisville; Patricia A. Ralston, University of Louisville
Paul M. Yanik, Western Carolina University; Yanjun Yan, Western Carolina University; Sudhir Kaul, Western Carolina University; Chip W. Ferguson, Western Carolina University
Michael J. Prince, Bucknell University; Katharyn E. K. Nottis, Bucknell University; Margot A. Vigeant, Bucknell University; Charles Kim, Bucknell University; Erin Jablonski, Bucknell University
Lokesh Padhye, Georgia Institute of Technology; Gretchen Goldman, Georgia Institute of Technology; Nadia Szeinbaum, Georgia Institute of Technology; Scott Rogers, Georgia Institute of Technology; Recep Goktas, Georgia Institute of Technology; Zohre Kurt, Georgia Institute of Technology
Wendy Crone, University of Wisconsin, Madison; Raelyn Rediske, University of Wisconsin, Madison; Steve Ackerman, University of Wisconsin, Madison; Sharon Dunwoody, University of Wisconsin, Madison