Peter M. Ostafichuk, University of British Columbia; Jim Sibley, University of British Columbia, Vancouver; H.F. Machiel Van der Loos, University of British Columbia
Wayne Weaver, Michigan Technological University; Jeremy John Worm P.E., Michigan Technological University; Jeffrey D. Naber, Michigan Technological University; Leonard J. Bohmann, Michigan Technological University; John E. Beard, Michigan Technological University; Carl L. Anderson, Michigan Technological University; Bo Chen, Michigan Technological University; Jason M. Keith, Mississippi State University
Susan Darling Urban, Texas Tech University; Joseph E Urban, Texas Tech University; Susan A. Mengel, Texas Tech University; William M. Marcy P.E., Texas Tech University; Patrick E. Patterson, Texas Tech University
Andy Shaojin Zhang, New York City College of Technology; Farrukh Zia, New York City College of Technology; Iem H. Heng, New York City College of Technology; Sidi Berri, New York City College of Technology
Mark Ardis, Stevens Institute of Technology; David Budgen, Durham University, UK; Gregory W. Hislop, Drexel University; Renée McCauley, College of Charleston; Mark J. Sebern, Milwaukee School of Engineering