Brent Guenther, Wright State University; Bruce Rahn, Wright State University; Mark Falknor, Wright State University; Adam Kelly, Wright State University; Bin Wang, Wright State University; Zhiqiang Wu, Wright State University
Matthew Green, LeTourneau University; Paul Leiffer, LeTourneau University; Thomas Hellmuth, LeTourneau University; Roger Gonzalez, LeTourneau University; Stephen Ayers, LeTourneau University
P. Ruby Mawasha, Wright State University; Kumar Yelamarthi, Wright State University; J. Mitch Wolff, Wright State University; Joseph Slater, Wright State University; Zhiqiang Wu, Wright State University
Wayne Walter, Rochester Institute of Technology; Jeffrey Webb, Rochester Institute of Technology; Mark Smith, Rochester Institute of Technology; Elizabeth DeBartolo, Rochester Institute of Technology; Margaret Bailey, Rochester Institute of Technology; George Slack, Rochester Institute of Technology
Mark Redekopp, University of Southern California; Cauligi Raghavendra, University of Southern California; Allan Weber, University of Southern California; Gisele Ragusa, University of Southern California; Therese Wilbur, University of Southern California
Faruk Yildiz, Sam Houston State University; Haley Claire Collins; Jessica L. Leatherwood, Sam Houston State University; Marcy Miller Beverly, Sam Houston State University; Mark J. Anderson, Sam Houston State University
Vukica M. Jovanovic, Old Dominion University; Tatiana V. Goris, Purdue University, Columbus, IN; Ana M. Djuric, Wayne State University; Petros J Katsioloudis, Old Dominion University; Nathan John Luetke, Old Dominion University; Moustafa R. Moustafa, Old Dominion University; Basim Matrood, Old Dominion University
Eric John Addeo, DeVry University; Nugroho Iwan Santoso, DeVry University, North Brunswick; Chao-Ying Wang, DeVry University, North Brunswick; Raul San Martin Rivadulla, Graduate Education
Antonio Jose Soares P.E., Florida A&M University; Doreen Kobelo, Florida A&M University/Florida State University; Chao Li, Florida A&M University/Florida State University; G. Thomas Bellarmine P.E., Florida A&M University/Florida State University
Richard Smith, Rensselaer Polytechnic Institute; Tracy N Schierenbeck, Rensselaer Polytechnic Institute; Linda McCloskey, Rensselaer Polytechnic Institute