Wade Fagen-Ulmschneider, University of Illinois, Urbana-Champaign; Cinda Heeren, University of Illinois, Urbana-Champaign; Geoffrey L. Herman, University of Illinois, Urbana-Champaign; Matthew West, University of Illinois, Urbana-Champaign
Jorge R. Lara, Texas A&M University; Sunay Palsole, Texas A&M University; Mark H. Weichold, Texas A&M University; Patrick Linke, Texas A&M University at Qatar
Esmeralda Campos, Tecnologico de Monterrey, Monterrey, Mexico; Carlos Eduardo Martinez-Torteya, Tecnologico de Monterrey (ITESM); Genaro Zavala, Tecnologico de Monterrey, Monterrey, Mexico and Universidad Andres Bello, Santiago, Chile
Steven R. Biegalski, Georgia Institute of Technology; Pavel V. Tsvetkov, Texas A&M University; Yuguo Tao, Georgia Institute of Technology; Vladimir Sobes, University of Tennessee at Knoxville; Karl Pazdernik, Pacific Northwest National Laboratory; Simon Labov, Lawrence Livermore National Laboratory; David F. Williams, Oak Ridge National Laboratory; James M. Ghawaly Jr., Oak Ridge National Laboratory; Alfred Olivier Hero, University of Michigan
Sebastian Dziallas, Fulbright University Vietnam; Naoko Ellis P.Eng., University of British Columbia; David Robert Bruce P.E., Fulbright University Vietnam
Edward F. Crawley, Massachusetts Institute of Technology; Mark Bathe, Massachusetts Institute of Technology; Rea Lavi, Massachusetts Institute of Technology; Amitava "Babi" Mitra, Massachusetts Institute of Technology
Kurt A. Thoroughman Ph.D., Washington University, St. Louis; Ranjan Patrick Khan, Washington University, St. Louis; Haoxin Sun, Washington University, St. Louis; Patricia L. Widder, Washington University, St. Louis
Lily Laiho, California Polytechnic State University; Nikki Adams, California Polytechnic State University; Kristen Cardinal, Cal Poly, San Luis Obispo; Matthew Burd, California Polytechnic State University; Daniel Walsh, California Polytechnic State University; Trevor Cardinal, California Polytechnic State University
AJ Hamlin, Michigan Technological University; Jean-Celeste M. Kampe, Michigan Technological University; Amy E. Monte, Michigan Technological University; Brett Hamlin, Michigan Technological University; Douglas E. Oppliger, Michigan Technological University