Asee peer logo
Well-matched quotation marks can be used to demarcate phrases, and the + and - operators can be used to require or exclude words respectively
Displaying all 11 results
Conference Session
Manufacturing Laboratory Experience
Collection
2006 Annual Conference & Exposition
Authors
Sheng-Jen Hsieh, Texas A&M University; Hye Jeong Kim, Texas A&M University
Tagged Divisions
Manufacturing
Conference Session
Manufacturing Laboratory Experience
Collection
2006 Annual Conference & Exposition
Authors
Sheng-Jen Hsieh, Texas A&M University; Landon Gray, Texas A&M University
Tagged Divisions
Manufacturing
Conference Session
Manufacturing Laboratory Experience
Collection
2006 Annual Conference & Exposition
Authors
Robert LeMaster, University of Tennessee-Martin; David Farrow, University of Tennessee-Martin
Tagged Divisions
Manufacturing
Conference Session
Manufacturing Laboratory Experience
Collection
2005 Annual Conference
Authors
Derek Yip-Hoi; Zbigniew Pasek
Conference Session
Manufacturing Laboratory Experience
Collection
2005 Annual Conference
Authors
William Kline
Conference Session
Manufacturing Laboratory Experience
Collection
2005 Annual Conference
Authors
Sheng-Jen Hsieh
Conference Session
Manufacturing Laboratory Experience
Collection
2006 Annual Conference & Exposition
Authors
Arif Sirinterlikci, Robert Morris University
Tagged Divisions
Manufacturing
Conference Session
Manufacturing Laboratory Experience
Collection
2005 Annual Conference
Authors
Glenn Blackwell
Conference Session
Manufacturing Laboratory Experience
Collection
2004 Annual Conference
Authors
Vedaraman Sriraman; Dugan Um
Conference Session
Manufacturing Laboratory Experience
Collection
2004 Annual Conference
Authors
Can Saygin
Conference Session
Manufacturing Laboratory Experience
Collection
2004 Annual Conference
Authors
Davis Charles; Tony Lin