Lanzerotti, M. Y., & Allen, C. I., & Doroski, M., & Medve, C., & Seery, M., & Orlando, P. L., & Khafizov, F. T. (2017, June), An Electrical Engineering Graduate Course Sequence in Integrated Circuits Targeted to Real-World Problems in Industry, Defense, and Security  Paper presented at 2017 ASEE Annual Conference & Exposition, Columbus, Ohio. 10.18260/1-2--27555

\bibitem{asee_peer_27555}
  Lanzerotti, M. Y., \& Allen, C. I., \& Doroski, M., \& Medve, C., \& Seery, M., \& Orlando, P. L., \& Khafizov, F. T. (2017, June), \emph{An Electrical Engineering Graduate Course Sequence in Integrated Circuits Targeted to Real-World Problems in Industry, Defense, and Security}
  Paper presented at 2017 ASEE Annual Conference \& Exposition, Columbus, Ohio.
  10.18260/1-2--27555

Mary Yvonne Lanzerotti, Christopher I. Allen, Michael Doroski, Curtis Medve, Michael Seery, P. Len Orlando III, and Farid T. Khafizov.  "An Electrical Engineering Graduate Course Sequence in Integrated Circuits Targeted to Real-World Problems in Industry, Defense, and Security".  2017 ASEE Annual Conference & Exposition, Columbus, Ohio, 2017, June.  ASEE Conferences, 2017.  https://peer.asee.org/27555 Internet.  18 Dec, 2024

\bibitem{asee_peer_27555}
  Mary Yvonne Lanzerotti, Christopher I. Allen, Michael Doroski, Curtis Medve, Michael Seery, P. Len Orlando III, and Farid T. Khafizov.
  "An Electrical Engineering Graduate Course Sequence in Integrated Circuits Targeted to Real-World Problems in Industry, Defense, and Security".
  \emph{2017 ASEE Annual Conference \& Exposition, Columbus, Ohio, 2017, June}.
  ASEE Conferences, 2017.
  https://peer.asee.org/27555 Internet.  18 Dec, 2024

@INPROCEEDINGS{asee_peer_27555
author = "Mary Yvonne Lanzerotti, Christopher I. Allen, Michael Doroski, Curtis Medve, Michael Seery, P. Len Orlando III, and Farid T. Khafizov"
title = "An Electrical Engineering Graduate Course Sequence in Integrated Circuits Targeted to Real-World Problems in Industry, Defense, and Security"
booktitle = "2017 ASEE Annual Conference \& Exposition"
year = "2017"
month = "June"
address = "Columbus, Ohio"
publisher = "ASEE Conferences"
note = {https://peer.asee.org/27555}
number = {10.18260/1-2--27555}
}

TY  - CPAPER
AB  - For the United States to maintain a globally competitive advantage in an increasingly advanced technology-based society, science and engineering curricula must produce technically competent leaders, researchers, scientists, and engineers. No field is more important in this regard than semiconductor design and fabrication of integrated circuits (ICs). A state-of-the-art course sequence in ICs that produces technically-competent circuit designers must include exposure to real-world design experience.  This paper describes a three-year study to introduce nine learner-centered instructional techniques into a two-course electrical engineering graduate course sequence in ICs targeted to real-world problems in industry, defense, and security.  The study measures the student learning in this two-course sequence with the use of a pre-test/post-test teaching methodology and is carried out through a collaboration of Air Force Research Laboratory Sensors Directorate and the Air Force Institute of Technology.  The participants in the study were officers at AFIT.  Military graduates from AFIT become project managers in national organizations, technology leaders in defense organizations, and practicing engineers at institutions such as AFRL.  

In recent years, considerable attention has 	been given to pretest-posttest knowledge gain assessment. Results presented in this paper demonstrate the effectiveness of a pre-test/post-test teaching 	methodology 	even 	when data is restricted to samples of small size. In addition to being an objective 	measurement of knowledge gain, this approach provides a framework for accurately assessing 	the influence of other factors on a student’s 	success. Results presented in this paper show that a statistically significant improvement was observed 	in the first course of the two-course sequence when the Diagnostic and Post-Diagnostic 	evaluation results were compared. Analysis of the final exam results for one 	course for Year 2 and Year 3 shows that there is statistically significant improvement in 	performance. This change is attributed to the improved teaching methodology presented in 	this paper. 

Future work will build statistical models for 	identifying what causes students the most difficulty in learning, so that the education can be 	made more effective. 

AU  - Mary Yvonne Lanzerotti
AU  - Christopher I. Allen
AU  - Michael Doroski
AU  - Curtis Medve
AU  - Michael Seery
AU  - P. Len Orlando III
AU  - Farid T. Khafizov
CY  - Columbus, Ohio
DA  - 2017/06/24
PB  - ASEE Conferences
TI  - An Electrical Engineering Graduate Course Sequence in Integrated Circuits Targeted to Real-World Problems in Industry, Defense, and Security
UR  - https://peer.asee.org/27555
DO  - 10.18260/1-2--27555
ER  -