ASEE PEER - Steven L Shumway

Steven L Shumway

Paper listing

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https://peer.asee.org/authors/22290

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A Study Abroad in the Dominican Republic: Mentoring University Students as They Prepare and Teach 6-12 Grade Students Technology and Engineering Concepts

Conference Session: Study Abroad, International Exchange Programs, and Student Engagements
Collection: 2011 ASEE Annual Conference & Exposition
Authors: Steven L. Shumway, Brigham Young University; SClaudina Vargas, Complex Systems Optimization Lab; Geoff Wright, Brigham Young University; Ron Terry, Brigham Young University

An Investigation of the Impact An ROV Competition Curriculum has on Student Interest in STEM, Specifically Technology and Engineering

Conference Session: K-12 & Pre-College Engineering Division: Use of Technology and Tools for K-12 Engineering Education
Collection: 2016 ASEE Annual Conference & Exposition
Authors: Daniel Gordon Mendiola Bates, Brigham Young University; Geoff Wright, Brigham Young University; Steven L. Shumway, Brigham Young University

Fostering Excellence in Teaching and Learning in a College of Engineering

Conference Session: Tricks of the Trade II
Collection: 2012 ASEE Annual Conference & Exposition
Authors: W. Vincent Wilding P.E., Brigham Young University; James K. Archibald, Brigham Young University; Paul Richards P.E., Brigham Young University; Steven L. Shumway, Brigham Young University; Brian D Jensen, Brigham Young University

The Development, Implementation, and Evaluation of Teaching Engineering Curriculum to Dominican Republic Junior High and High School Students

Conference Session: International Division Technical Session 7
Collection: 2015 ASEE Annual Conference & Exposition
Authors: Geoff Wright, Brigham Young University; Steven L Shumway, Brigham Young University

The Teaching and Evaluation of Technology and Engineering Concepts to Dominican Junior High and High School Students

Conference Session: Accreditation, Program Evaluation, and Education Resource's Impact in Latin America
Collection: 2013 ASEE Annual Conference & Exposition
Authors: Geoff Wright, Brigham Young University; Ron Terry, Brigham Young University; Steven L Shumway, Bringham Young University; Richard G. Helps, Brigham Young University