Asee peer logo
advanced search

Christopher Grachanen

Permalink

Paper listing

Permanent URL

https://peer.asee.org/authors/7549

Co-authors:

Ncsli Metrology Education Outreach

Conference Session
Metrology Laboratories
Collection
2008 Annual Conference & Exposition
Authors
Georgia Harris, National Institute of Standards & Technology; Christopher Grachanen, Hewlett Packard Company