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Avik Dayal
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Paper listing
Permanent URL
https://peer.asee.org/authors/25996
Co-authors:
Louis Beex
Kathleen Meehan
Closing the Design Cycle: Integration of Analysis, Simulation, and Measurements Results to Guide Students on Evaluation of Design
Conference Session
Laboratory Experiences in Electronics and Circuits
Collection
2013 ASEE Annual Conference & Exposition
Authors
Avik Dayal,
Virginia Tech
; Kathleen Meehan,
Virginia Tech
; A. A. (Louis) Beex,
Virginia Tech