ASEE PEER - Louis Beex

Louis Beex

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Closing the Design Cycle: Integration of Analysis, Simulation, and Measurements Results to Guide Students on Evaluation of Design

Conference Session: Laboratory Experiences in Electronics and Circuits
Collection: 2013 ASEE Annual Conference & Exposition
Authors: Avik Dayal, Virginia Tech; Kathleen Meehan, Virginia Tech; A. A. (Louis) Beex, Virginia Tech