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Louis Beex

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https://peer.asee.org/authors/25997

Co-authors:

Closing the Design Cycle: Integration of Analysis, Simulation, and Measurements Results to Guide Students on Evaluation of Design

Conference Session
Laboratory Experiences in Electronics and Circuits
Collection
2013 ASEE Annual Conference & Exposition
Authors
Avik Dayal, Virginia Tech; Kathleen Meehan, Virginia Tech; A. A. (Louis) Beex, Virginia Tech