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Chinedu Alexander Emeka

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https://peer.asee.org/authors/58126

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Determining the Best Policies for Second-Chance Tests for STEM Students

Conference Session
Student Assessments and Tests
Collection
2023 ASEE Annual Conference & Exposition
Authors
Chinedu Alexander Emeka, University of Illinois at Urbana-Champaign; David H. Smith IV, University of Illinois at Urbana-Champaign; Craig Zilles, University of Illinois at Urbana-Champaign; Matthew West, University of Illinois at Urbana-Champaign; Geoffrey L. Herman, University of Illinois at Urbana - Champaign; Timothy Bretl, University of Illinois at Urbana-Champaign

Second-Chance Testing as a Means of Reducing Students' Test Anxiety and Improving Outcomes

Conference Session
Student Assessments and Tests
Collection
2023 ASEE Annual Conference & Exposition
Authors
Chinedu Alexander Emeka; Craig Zilles, University of Illinois at Urbana-Champaign; Matthew West, University of Illinois at Urbana-Champaign; Geoffrey L. Herman, University of Illinois at Urbana-Champaign; Timothy Bretl, University of Illinois at Urbana-Champaign