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David Hamilton Smith IV

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https://peer.asee.org/authors/58128

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Determining the Best Policies for Second-Chance Tests for STEM Students

Conference Session
Student Assessments and Tests
Collection
2023 ASEE Annual Conference & Exposition
Authors
Chinedu Alexander Emeka, University of Illinois at Urbana-Champaign; David H. Smith IV, University of Illinois at Urbana-Champaign; Craig Zilles, University of Illinois at Urbana-Champaign; Matthew West, University of Illinois at Urbana-Champaign; Geoffrey L. Herman, University of Illinois at Urbana - Champaign; Timothy Bretl, University of Illinois at Urbana-Champaign

Understanding the impacts of extra credit modules on students’ learning experience in a 100-level electrical and computer engineering course

Conference Session
First-Year Programs Division (FYP) - Technical Session 1: Course Design
Collection
2023 ASEE Annual Conference & Exposition
Authors
David H. Smith IV, University of Illinois at Urbana-Champaign; Ujjal K. Bhowmik, University of Illinois at Urbana-Champaign; Yuting W. Chen, University of Illinois Urbana-Champaign