Permanent URL
https://peer.asee.org/authors/1972
Co-authors:
- Conference Session
- TAC/ABET Related Outcome Based Assessment Methods and Models
- Collection
- 2011 ASEE Annual Conference & Exposition
- Authors
- Ilya Grinberg, Buffalo State College; Ronald E. Land, Pennsylvania State University, New Kensington; Thomas M. Hall Jr., Northwestern State University; Kelly Ann Lacroix, Society of Manufacturing Engineers; Steve Macho, Buffalo State College; Mike Eastman, Rochester Institute of Technology
- Conference Session
- ETD Design V: Classroom Delivery, Course Content, and Assessments
- Collection
- 2011 ASEE Annual Conference & Exposition
- Authors
- Mike Eastman, Rochester Institute of Technology; Fred Walker, Rochester Institute of Technology
- Conference Session
- Emerging Trends in Engineering Education
- Collection
- 2004 Annual Conference
- Authors
- Richard Cliver; Mike Eastman
- Conference Session
- Two-Year to Four-Year Transfer Programs: Best Practices
- Collection
- 2016 ASEE Annual Conference & Exposition
- Authors
- Surendra K. Gupta, Rochester Institute of Technology (COE); James E Moon, Rochester Institute of Technology (COE); Mike Eastman, Rochester Institute of Technology (CAST); Daniel P Johnson, Rochester Institute of Technology (CAST); Todd Dunn, Rochester Institute of Technology (CAST)
- Conference Session
- Two-year Institutions Help Fill the STEM Pipeline
- Collection
- 2012 ASEE Annual Conference & Exposition
- Authors
- Surendra K. Gupta, Rochester Institute of Technology; Daniel P. Johnson, Rochester Institute of Technology; John Morelli P.E., Rochester Institute of Technology; Mike Eastman, Rochester Institute of Technology; Vincent Joseph Amuso Sr., Rochester Institute of Technology
- Collection
- 2019 ASEE Zone I Conference & Workshop
- Authors
- Lisa Greenwood; Mark Indelicato; Miguel Bazdresch; Mike Eastman
- Conference Session
- An Examination of Methods to Enhance Transfer Student Enrollment, Retenion, Persistence, and Outcomes
- Collection
- 2014 ASEE Annual Conference & Exposition
- Authors
- Surendra K. Gupta, Rochester Institute of Technology (COE); Daniel P. Johnson, Rochester Institute of Technology (CAST); Mike Eastman, Rochester Institute of Technology (CAST); Vincent Joseph Amuso Sr., Rochester Institute of Technology; John Morelli, Rochester Institute of Technology (CAST)