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Shi (Stan) Lan

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https://peer.asee.org/authors/101

Co-authors:

A Comparative Analysis On Learning Characteristics Between Electronics Students In China And In The United States

Conference Session
International Case Studies, Collaborations and Interactions
Collection
2006 Annual Conference & Exposition
Authors
Shi (Stan) Lan, DeVry University-Chicago; Yaqing Mao, Beijing Normal University, China