June 15, 2019
June 15, 2019
June 19, 2019
The principal component of the introductory electronics course at (institution name) introduces students to the electrical characteristics of basic electronic devices (diodes, Zener diodes, MOSFETs, and BJTs). The accompanying laboratory includes experiments on measurement of the IV characteristics of these devices and derivation of small-signal models from those characteristics. Experimental procedures for measurement of IV characteristics have been in place at (institution name) for a number of years, but the development of “lab-in-a-box” solutions (such as the National Instruments myDAQ) has provided impetus to redesign these experiments to be compatible with that paradigm. To that end, (institution name) has designed a curve-tracer module that is compatible with the myDAQ and which allows students to make direct measurements of IV characteristics of diodes, Zener diodes, MOSFETs, and BJTs using no ancillary equipment apart from the myDAQ (and host computer) and the device(s) under test. It is constructed with an inexpensive single-sided printed-circuit board and uses readily-available components. LabVIEW programs that automate the display of families of IV curves for MOSFETs and BJTs are under development. Complete schematic diagrams and PCB artwork are available for easy replication. This paper will describe the curve tracer, supporting programs, and examples of its application in the laboratory environment.
Beams, D. M. (2019, June), myDAQ-Compatible Curve Tracer Module for Introductory Electronics Laboratories Paper presented at 2019 ASEE Annual Conference & Exposition , Tampa, Florida. 10.18260/1-2--33131
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