Gentry, A., & Bermel, P., & Holloway, E., & Douglas, K. (2022, August), Validity Evidence for Exposure and Motivation Scales in a Microelectronics Workforce Development Program  Paper presented at 2022 ASEE Annual Conference & Exposition, Minneapolis, MN. 10.18260/1-2--40872

\bibitem{asee_peer_40872}
  Gentry, A., \& Bermel, P., \& Holloway, E., \& Douglas, K. (2022, August), \emph{Validity Evidence for Exposure and Motivation Scales in a Microelectronics Workforce Development Program}
  Paper presented at 2022 ASEE Annual Conference \& Exposition, Minneapolis, MN.
  10.18260/1-2--40872

Adrian Gentry, Peter Bermel, Eric Holloway, and Kerrie Douglas.  "Validity Evidence for Exposure and Motivation Scales in a Microelectronics Workforce Development Program".  2022 ASEE Annual Conference & Exposition, Minneapolis, MN, 2022, August.  ASEE Conferences, 2022.  https://peer.asee.org/40872 Internet.  15 Dec, 2024

\bibitem{asee_peer_40872}
  Adrian Gentry, Peter Bermel, Eric Holloway, and Kerrie Douglas.
  "Validity Evidence for Exposure and Motivation Scales in a Microelectronics Workforce Development Program".
  \emph{2022 ASEE Annual Conference \& Exposition, Minneapolis, MN, 2022, August}.
  ASEE Conferences, 2022.
  https://peer.asee.org/40872 Internet.  15 Dec, 2024

@INPROCEEDINGS{asee_peer_40872
author = "Adrian Gentry, Peter Bermel, Eric Holloway, and Kerrie Douglas"
title = "Validity Evidence for Exposure and Motivation Scales in a Microelectronics Workforce Development Program"
booktitle = "2022 ASEE Annual Conference \& Exposition"
year = "2022"
month = "August"
address = "Minneapolis, MN"
publisher = "ASEE Conferences"
note = {https://peer.asee.org/40872}
number = {10.18260/1-2--40872}
}

TY  - CPAPER
AB  - Microelectronics play an increasingly important role in a wide range of technologies, which
include not just computers but many consumer, business, and defense capabilities. To ensure a
reliable source of microelectronic chips in the future, it is crucial to train an increasing number of
students in this area and to foster their connection with the industry and government employers.
As training programs are being stood up now, it is important to determine whether they are
effective in meeting these goals. Our team modified an existing assessment of students’ exposure
and motivation to focus explicitly on topics in microelectronics. The purpose of this paper is to
evaluate validity evidence in terms of item functioning and factor structure. Specifically, we ask:
1) To what extent do the Exposure and Motivation items function as intended (i.e., items written
to be exposure factor together and items written at motivation factor together); 2) To what extent
are the items measuring Exposure and Motivation in microelectronics in a sensitive way (i.e., the
items are able to detect the expected variance among students)? The assessment was
administered as a pre- and post-survey to undergraduate engineering students in an introductory
engineering design course (n = 508). Confirmatory factor analysis (CFA) was performed to
compare the model fit for several models. Results from the CFA in terms of factor structure and
goodness of fit confirm the two scales, Exposure and Motivation, are consistent with the original
instrument. An item response theory (IRT) model was found, which indicated the two scales can
sensitively measure differing levels of motivation and exposure. This study provides an
assessment with validity evidence that it can be adapted for different technical areas and still
provide meaningful information regarding students’ exposure and motivation in a specific area. 
AU  - Adrian Gentry
AU  - Peter Bermel
AU  - Eric Holloway
AU  - Kerrie Douglas
CY  - Minneapolis, MN
DA  - 2022/08/23
PB  - ASEE Conferences
TI  - Validity Evidence for Exposure and Motivation Scales in a Microelectronics Workforce Development Program
UR  - https://peer.asee.org/40872
DO  - 10.18260/1-2--40872
ER  -