Displaying all 7 results
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- Student Engagement in ECE
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- 2010 Annual Conference & Exposition
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- Maher Rizkalla, Indiana University-Purdue University, Indianapolis; MIchael Knieser, ILSI; Mohamed El-Sharkawy, Purdue University
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- Electrical and Computer
Multidisciplinary Project:RF CMOS Voltage Controlled Oscillator (VCO) that is capable of generating an outputfrequency near 5GHz for monitoring neural and cardiac activities. The circuit topologyhas been chosen to achieve such high frequency with high Q-factor. The team project Page 15.974.6works on the transmitter circuit and its layout with L-Edit software is given. Thisincludes the prescribed inductances and capacitances required to achieve the designspecifications. Figures 4 and 5 show the schematics of an rf amplifier that was simulatedwith PSpice, and the result is given in figure 6. The results provide the 5 GHz VCO thatmeets the design specifications. The
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- New Trends in ECE Education
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- 2010 Annual Conference & Exposition
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- Paul Cotae, University of the District of Columbia; Esther Ososanya, University of the District of Columbia; Lily Kemathe, University of the District of Columbia; Suresh Regmi, University of the District of Columbia; Kamden Patrice Kouam, The University of the District of Columbia
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- Electrical and Computer
. Page 15.1383.10 [16] Q. Rong, D. Ceglarek and J. Shi, “Dimensional fault diagnosis for compliant beam structure assemblies,” Manuf. Sci. Eng. J., vol. 122, pp. 773–780, 2000.[17] Q. Rong, D. Ceglarek and J. Shi, “Adjusted least squares approach for diagnosis of ill-conditioned compliant assemblies,” Manuf. Sci. Eng. J., vol. 123, pp. 453–461, 2001.[18] W. Cai, J. S.Hu, and X. J. Yuan, “Deformable sheet metal fixturing: principles, algorithms and simulations,” Transaction of ASME, Journal of Manuf. Sci. Eng., vol. 118, pp. 318–324, 1996.[19] Y. Ding, P. Kim, D. Ceglarek and J. Jin, ‘‘Optimal sensor distribution for variation diagnosis for multi- station assembly processes,’’ IEEE Trans. Rob. Autom., vol. 19, pp. 543–556, 2003
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- Embedded System Design
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- 2010 Annual Conference & Exposition
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- Sven Bilen, Pennsylvania State University; Okhtay Azarmanesh, Pennsylvania State University
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- Electrical and Computer
. Page 15.556.3 Single Carriers Band Pass Single carrier Normality I-Q Modulations diagrams modulations test OFDM, n carriers Multi Carriers Parameter extraction Figure 1. Tree structure of modulation classificationThis simple diagram then involved working on different Gaussianity tests (which
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- Innovations in ECE Education
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- 2010 Annual Conference & Exposition
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- L. Brent Jenkins, Southern Polytechnic State University
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- Electrical and Computer
Ideal transformers Transfer functions Introductory coverage Frequency response Resonance Filters Two-port networks Topics to be taught in Electronics Bandwidth and Q Shifted Content Three-phase systems Topics to be taught in Electric Machines
- Conference Session
- Student Engagement in ECE
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- 2010 Annual Conference & Exposition
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- Sergey Makarov, Worcester Polytechnic Institute; Reinhold Ludwig, Worcester Polytechnic Institute; Stephen Bitar, Worcester Polytechnic Institute
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- Electrical and Computer
(1) kT where p 0 is the undisturbed concentration (when particles with all energies and all "speeds" arepresent) and k is the Boltzmann constant, k=1.3806610-23J/K. The implication of Eq. (1) can beenhanced by a number of relevant examples given in class. Some of them may be quite funny.As a next step, Eq. (1) is then applied to the carrier distribution in semiconductors. We keep inmind that the concentration of charge carries able to overcome the potential hill of is givenby Eq. (1), if ET q . This readily leads to the carrier distribution in a doped semiconductorsubject to a built-in electric field due to a depletion layer, or due to an external electric field, orboth, and enables us to link to all related results
- Conference Session
- Student Engagement in ECE
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- 2010 Annual Conference & Exposition
- Authors
- Eric Freudenthal, University of Texas, El Paso; Rebeca Gonzalez, Chapin High School; Sarah Hug, University of Colorado; Alexandria Ogrey, University of Texas, El Paso; Mary Kay Roy, University of Texas, El Paso; Alan Siegel, NYU
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- Electrical and Computer
- Conference Session
- Design in the ECE Curriculum
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- 2010 Annual Conference & Exposition
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- Randal Abler, Georgia Tech; James Krogmeier, Purdue University; Aaron Ault, Purdue University; Julia Melkers, Georgia Institute of Technology; Tamara Clegg, Georgia Institute of Technology; Edward Coyle, Georgia Institute of Technology
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- Electrical and Computer