Zhiwei Guan, University of Washington; Steve Lappenbusch, University of Washington; Jennifer Turns, University of Washington; Jessica Yellin, University of Washington
Jessica Yellin, University of Washington; Yi-Min Huang, University of Washington; Jennifer Turns, University of Washington; Charity Tsuruda, University of Washington
Yi-Min Huang, University of Washington; Matt Eliot, University of Washington; Jennifer Turns, University of Washington; Emma Rose, University of Washington; Jessica Yellin, University of Washington
Convergence of Quality Assurance Systems Around the Globe
Collection
2006 Annual Conference & Exposition
Authors
Kurt Paterson, Michigan Technological University; Linda Phillips, Michigan Technological University; David Watkins, Michigan Technological University; James Mihelcic, Michigan Technological University
ChE: Departmental Issues and Integrating Freshmen into the ChE Program
Collection
2006 Annual Conference & Exposition
Authors
David Silverstein, University of Kentucky; Daina Briedis, Michigan State University; Kevin Dahm, Rowan University; Richard Zollars, Washington State University
Daniel Oerther, University of Cincinnati; Cinnamon Carlarne, University of Cincinnati; Eric Maurer, University of Cincinnati; Regina Lamendella, University of Cincinnati; Sarah Pumphrey, University of Cincinnati
Angela Bielefeldt, University of Colorado-Boulder; Diana Shannon, University of Colorado-Denver; Jay Shah, University of Colorado-Boulder; R. Scott Summers, University of Colorado-Boulder; Jim Ruttenber, University of Colorado
Eric Beckman, University of Pittsburgh; Gena Kovalcik, University of Pittsburgh; Mary Besterfield-Sacre, University of Pittsburgh; Robert Ries, University of Pittsburgh; Kim Needy, University of Pittsburgh; Laura Schaefer, University of Pittsburgh; Larry Shuman, University of Pittsburgh