Daniel Walsh, California Polytechnic State University; Stacey Breitenbach, California Polytechnic State University; Robert Crocket, California Polytechnic State University
Lisa Frehill; Amanda Lain, New Mexico State University; Ricardo Jacquez, New Mexico State University; Lauren Ketcham, New Mexico State University; Karen Luces, New Mexico State University
Eugene DeLoatch, Morgan State University; Sherra Kerns, Franklin W. Olin College of Engineering; Lueny Morell, Hewlett-Packard; Carla Purdy, University of Cincinnati; Paige Smith, University of Maryland; Samuel Truesdale, Rolls-Royce Corporation; Barbara Waugh, Hewlett-Packard Company
Jonathan Godfrey, Western Carolina University; James Zhang, Western Carolina University; Aaron Ball, Western Carolina University; Robert Adams, Western Carolina University
Charles Farrar, Los Alamos National Laboratory; Michael Todd, University of California-San Diego; Phillip Cornwell, Rose-Hulman Institute of Technology
Ronald Kane, New Jersey Institute of Technology; Clarisa Gonzalez-Lenahan, New Jersey Institute of Technology; Stephen Eck, New Jersey Institute of Technology
Roger Olson, Rolls-Royce Corporation; David Quick, Rolls-Royce Corporation; Samuel Truesdale, Rolls-Royce Corporation; Dennis Depew, Purdue University; Gary Bertoline, Purdue University; Mark Schuver, Purdue University; Duane Dunlap, Western Carolina University; Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina
Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; John Bardo, Western Carolina University; Duane Dunlap, Western Carolina University; Stephen Tricamo, New Jersey Institute of Technology; Eugene DeLoatch, Morgan State University; Dennis Depew, Purdue University; Mark Schuver, Purdue University; Gary Bertoline, Purdue University; Albert McHenry, Arizona State University; Timothy Lindquist, Arizona State University; Joseph Tidwell, Boeing Co.; Mark Smith, Rochester Institute of Technology; Raymond Morrison, Lockheed Martin Aeronautics Co.; Harvey Palmer, Rochester Institute of Technology; Norman Egbert; David Quick, Rolls-Royce Corporation; Roger Olson, Rolls-Royce Corporation; Mohammad Noori, California State Polytechnic University; Samuel Truesdale, Rolls-Royce Corporation; Edward Sullivan, California Polytechnic State University; Joseph Rencis, University of Arkansas; Carla Purdy, University of Cincinnati
Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; John Bardo, Western Carolina University; Duane Dunlap, Western Carolina University; Gary Bertoline, Purdue University; Dennis Depew, Purdue University; Mark Schuver, Purdue University; Eugene DeLoatch, Morgan State University; Stephen Tricamo, New Jersey Institute of Technology; Timothy Lindquist, Arizona State University; Albert McHenry, Arizona State University; Harvey Palmer, Rochester Institute of; David Quick, Rolls-Royce Corporation; Mohammad Noori, California State Polytechnic University; Joseph Tidwell, Boeing Co.; Roger Olson, Rolls-Royce Corporation; Samuel Truesdale, Rolls-Royce Corporation
Mark Schuver, Purdue University; Mark Smith, Rochester Institute of Technology; Duane Dunlap, Western Carolina University; Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; Joseph Tidwell, Boeing Co.
Dennis Depew, Purdue University; Gary Bertoline, Purdue University; Mark Schuver, Purdue University; Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; Duane Dunlap, Western Carolina University
Thomas Stanford, University of South Carolina; Donald Keating, University of South Carolina; Duane Dunlap, Western Carolina University; Roger Olson, Rolls-Royce Corporation
Ronald Kane, New Jersey Institute of Technology; Clarisa Gonzalez-Lenahan, New Jersey Institute of Technology; Michael Kerley, New Jersey Institute of Technology; Jerome Paris, New Jersey Institute of Technology; Janet Bodner, New Jersey Institute of Technology; Ronald Rockland, New Jersey Institute of Technology