Kurt A. Thoroughman Ph.D., Washington University, St. Louis; Ranjan Patrick Khan, Washington University, St. Louis; Haoxin Sun, Washington University, St. Louis; Patricia L. Widder, Washington University, St. Louis
AJ Hamlin, Michigan Technological University; Jean-Celeste M. Kampe, Michigan Technological University; Amy E. Monte, Michigan Technological University; Brett Hamlin, Michigan Technological University; Douglas E. Oppliger, Michigan Technological University