Technical Session 11: Topics related to Computer Science
Collection
2019 ASEE Annual Conference & Exposition
Authors
Joe Michael Allen, University of California, Riverside; Kelly Downey; Kris Miller; Alex Daniel Edgcomb, Zybooks; Frank Vahid, University of California, Riverside
Technical Session 1: Issues Impacting Students Learning How to Program
Collection
2019 ASEE Annual Conference & Exposition
Authors
A.T.M. Golam Bari, University of South Florida; Alessio Gaspar, University of South Florida; R. Paul Wiegand, University of Central Florida, School of Modeling, Simulation, & Training; Dmytro Vitel; Kok Cheng Tan; Stephen John Kozakoff, University of South Florida
Technical Session 11: Topics related to Computer Science
Collection
2019 ASEE Annual Conference & Exposition
Authors
Leila Zahedi, Florida International University; Monique S Ross, Florida International University; Jasmine Skye Batten, Florida International University
Technical Session 1: Issues Impacting Students Learning How to Program
Collection
2019 ASEE Annual Conference & Exposition
Authors
J.w. Bruce, Tennessee Technological University; Bryan A. Jones, Mississippi State University; Mahnas Jean Mohammadi-Aragh, Mississippi State University
Michael A. Gennert, Worcester Polytechnic Institute; Nima Lotfi, Southern Illinois University, Edwardsville; James A. Mynderse, Lawrence Technological University; Monique Jethwani; Vikram Kapila, NYU’s Tandon School of Engineering
Julian Ly Davis, University of Southern Indiana; Tom McDonald, University of Southern Indiana; Bradley Lane Kicklighter, University of Southern Indiana
Rhonda Kay Gaede, University of Alabama, Huntsville; Thomas Morris, University of Alabama, Huntsville; Rishabh Das; Yu Lei; Thiago Alves, University of Alabama, Huntsville ; Hongyu Zhou, University of Alabama, Huntsville; Farbod Fahimi, University of Alabama, Huntsville
Samuel Aaron Snyder, Virginia Tech; Desen Sevi Özkan, Virginia Tech; Diana Bairaktarova, Virginia Tech; Thomas W. Staley, Virginia Tech; Stephen Biscotte, Virginia Tech
Ahmed Cherif Megri, North Carolina A&T State University; Sameer Hamoush P.E., North Carolina A&T State University; Rachid Belmasrour, Southern University at New Orleans; Gwen Lee-Thomas, Quality Measures
Harold T. Evensen, University of Wisconsin, Platteville; Molly M. Gribb P.E., University of Wisconsin, Platteville; Adel Nasiri, University of Wisconsin, Milwaukee
Edward F. Crawley, Massachusetts Institute of Technology; Anette Hosoi, Massachusetts Institute of Technology; Gregory L. Long Ph.D., Massachusetts Institute of Technology; Timothy Kassis, Massachusetts Institute of Technology; William Dickson, General Motors; Amitava 'Babi' Mitra, Massachusetts Institute of Technology
Amelia Greig, California Polytechnic State University, San Luis Obispo; Alex Powaser, California Polytechnic State University, San Luis Obispo; Douglas Howe, California Polytechnic State University, San Luis Obispo; Will Alan McGehee, California Polytechnic State University
Mahdi Norouzi, Grand Valley State University; Janice S. Pawloski, Grand Valley State University; Huihui Qi, Grand Valley State University; Farid Jafari, Grand Valley State University
Nithil Kumar Bollock, Saint Louis University; Matthew Patrick O'Brien; Yan Gai, Saint Louis University, Parks College of Eng.; Stephen M. Belt, Saint Louis University
Gang Zheng, University of Michigan-Shanghai Jiao Tong University Joint Institute; Horst Hohberger, University of Michigan - Shanghai Jiao Tong University Joint Institute; Chengbin Ma, University of Michigan–Shanghai Jiao Tong University Joint Institute; Pradeep Ray, University of Michigan Joint Institute, Shanghai Jiao Tong University
Kristoffer Borgen, Purdue University; William Theodore Weldon, Purdue University; Brian Kozak, Purdue Polytechnic Institute; Tracy L. Yother, Purdue Polytechnic Institute