Krystal S. Corbett, Louisiana Tech University; Heath Tims, Louisiana Tech University; Galen E. Turner III, Louisiana Tech University; James D. Nelson, Louisiana Tech University
Edward James Christie; Daniel D. Jensen, U.S. Air Force Academy; Richard T. Buckley Ph.D., U.S. Air Force Academy; Devin A. Menefee, U.S. Air Force Academy; Kyle Kenneth Ziegler; Kristin L. Wood, University of Texas, Austin; Richard H. Crawford, University of Texas, Austin
Yosef S. Allam, Embry-Riddle Aeronautical University, Daytona Beach; Clifford A. Whitfield, Ohio State University; Jintana Nina Phanthanousy, Embry-Riddle Aeronautical University
Yuyi Lin P.E., University of Missouri; Xiuting Wei, Shandong University of Technology; Lanmei Wang, Shandong University of Technology; Yanfei Zhang, Shandong University of Technology; Wenqiang Yu P.E., Shandong University of Technology; Yufeng Sun, Shandong University of Technology
Lee king-lien, National Taipei University of Technology, Department of Electro-Optic Engineering; Chih-Hsiung Ku, National Dong Hwa University; Chao-Chia heng, National Central University
Anouk Desjardins, Écoel Polytechnique de Montréal; Louise Millette, Écoel Polytechnique de Montréal; Marc-André Plasse, _naturehumaine; Erik Belanger, Écoel Polytechnique de Montréal
Phillip A. Farrington, University of Alabama, Huntsville; Michael P.J. Benfield, University of Alabama, Huntsville; Matthew W. Turner, University of Alabama, Huntsville
Teresa Genevieve Wojcik, Villanova University; M. Clayton, Villanova University; Aleksandra Radlinska, Villanova University; Noelle K. Comolli, Villanova University