Samuel H. Huang, University of Cincinnati; Sam Anand, University of Cincinnati; Manish Kumar, University of Toledo; Imelda Castañeda-Emenaker, University of Cincinnati
Marilyn Barger, FLATE: Florida Advanced Technological Education Center of Excellence; Richard Gilbert, University of South Florida; James Janisse, Fox Valley Technical College
Jeremy John Vaillant, University of Massachusetts, Lowell ; Christopher J. Hansen, University of Massachusetts, Lowell; Stephen Johnston, University of Massachusetts, Lowell; Sammy G. Shina, University of Massachusetts, Lowell; David Willis, University of Massachusetts, Lowell
Nikki Larson, Western Washington University; William Rasnack; Nicole Hoekstra, Western Washington University; Chloe Boland, Space Exploration Technologies; Eric Leone; Isaac Santos; Katherine Rust Healy; Tanveer Singh Chawla, Western Washington University; Sunni Shoepe
Latest Trends and Implementations in Manufacturing Education
Collection
2015 ASEE Annual Conference & Exposition
Authors
Fazleena Badurdeen, University of Kentucky; John R. Baker, University of Kentucky; Keith E. Rouch, University of Kentucky; Christine F. Goble, University of Kentucky; Gerry M. Swan II, University of Kentucky; Adam Brown, University of Kentucky; I. S. Jawahir, University of Kentucky
Tzu-Liang Bill Tseng, University of Texas, El Paso; Richard Chiou, Drexel University; Radian G. Belu, University of Alaska Anchorage; Oscar H. Salcedo, University of Texas, El Paso; Aditya Akundi, University of Texas, El Paso; Eric D. Smith, University of Texas, El Paso
Niaz Latif, Purdue University, Calumet; Steven Wendel, Sinclair Community College; Mohammad A. Zahraee, Purdue University, Calumet; Aco Sikoski, Ivy Tech Community College; Ronald J. Bennett F.ASEE, F.ABET P.E., University of St. Thomas
Margot A Vigeant, Bucknell University; Nathan P. Siegel P.E., Bucknell University; Karen T. Marosi, Bucknell University; R. Alan Cheville, Bucknell University; Eric A. Kennedy, Bucknell University; Charles Kim, Bucknell University; Joe Tranquillo, Bucknell University; David E Cipoletti, Bucknell University; Kyle Montgomery, Bucknell University; Kerra Mercon; Laura Kathleen Poss, Bucknell University; Zachary Paul Ross, Bucknell University; Dan Robert Muccio
William Sarkis Babikian, Vaughn College of Aeronautics & Technology; Terry K Beesoon, Vaughn College of Aeronautics and Technology; Shouling He, Vaughn College of Aeronautics & Technology; Hossein Rahemi, Vaughn College of Aeronautics & Technology
Charles M Schweik, University of Massachusetts, Amherst; Paula Rees, University of Massachusetts, Amherst; Steven D Brewer, University of Massachusetts Amherst; Christine Olson; Dan Smoliga
Sven G. Bilen, Pennsylvania State University, University Park; Timothy F. Wheeler, Pennsylvania State University, University Park; Randall G Bock, Pennsylvania State University, University Park
Andy Zhang, New York City College of Technology; Angran Xiao, New York City College of Technology, City University of New York; Bijan Bayat Mokhtari, Aalto University, New York City College of Technology; Ali Harb
Sangarappillai Sivaloganathan, United Arab Emirates University; Hayder Zulafqar Ali, University Instructor; Iman Abdulwaheed, United Arab Emirates University; Sayeda Abboud Al Ameri, United Arab Emirates University