Wayne E. Whiteman, Georgia Institute of Technology; William J. Wepfer, Georgia Institute of Technology; Jeffrey A. Donnell, Georgia Institute of Technology
Allan T. Kirkpatrick, Colorado State University; Scott Danielson, Arizona State University, Polytechnic campus; Robert O. Warrington, Michigan Technological University; Richard N. Smith, Rensselaer Polytechnic Institute; Karen A. Thole, Pennsylvania State University, University Park; A. Kulacki, University of Minnesota, Twin Cities; William J. Wepfer, Georgia Institute of Technology; Thomas Perry, P.E., American Society of Mechanical Engineers
Laila Guessous, Oakland University; Qian Zou, Oakland University; Brian P. Sangeorzan, Oakland University; Xia Wang, Oakland University; Gary Barber, Oakland University; Lorenzo M. Smith, Oakland University; LianXiang Yang, Oakland University; David Schall, Oakland University, Department of Mechanical Engineering; Michael A. Latcha, Oakland University
Eric C. Dierks, University of Texas, Austin; Jason M. Weaver, University of Texas, Austin; Kristin L. Wood, University of Texas, Austin; Kendra Crider, U.S. Air Force Academy; Daniel D. Jensen, U.S. Air Force Academy
Amy C. Bradshaw, University of Oklahoma; Zahed Siddique, University of Oklahoma; Patricia Lea Hardre, University of Oklahoma; Farrokh Mistree, University of Oklahoma
AnnMarie Thomas, University of Saint Thomas; Keith Berrier, University of Saint Thomas; Andrea Guggenbuehl, University of Saint Thomas, Health and Human Performance Department
Yunfeng Wang, College of New Jersey; Christopher Ault, College of New Jersey; Teresa Marrin Nakra, College of New Jersey; Andrea Salgian, College of New Jersey; Meredith K. Stone, Independent Evaluator
Patrick W. Pace, University of Texas, Austin; Kristin L. Wood, University of Texas, Austin; John J. Wood, U.S. Air Force Academy; Daniel D. Jensen, U.S. Air Force Academy; Brian K Skibba, Air Force Research Laboratory
Anthony William Duva, Wentworth Institute of Technology; Ali Moazed, Wentworth Institute of Technology; Xiaobin Le, Wentworth Institute of Technology ; Richard L. Roberts, Wentworth Institute of Technology