Yakov E. Cherner, ATEL, LLC; Maija M. Kuklja, University of Maryland College Park; Alexander Rudy, Institute of Physics and Technology of RAS, Yaroslavl Branch
Steven H. Billis, New York Institute of Technology; Nada Marie Anid, New York Institute of Technology; Marta A Panero, New York Institute of Technology
Yalcin Ertekin, Drexel University (Tech.); Irina Nicoleta Ciobanescu Husanu, Drexel University (Tech.); Richard Chiou, Drexel University (Eng. & Eng. Tech.)
Nadir Yilmaz P.E., New Mexico Institute of Mining and Technology; Kyle Jeffrey Benalil, New Mexico Institute of Mining and Technology; Francisco Martín Vigil, New Mexico Institute of Mining and Technology
Bill Williams, ESTBarreiro, Setubal Polytechnic Institute; Phillip C. Wankat, Purdue University, West Lafayette; Pedro Neto P.E., Polytechnic Institute of Setubal ; Carlos Alexandre Tiago, ESTBarreiro, IPS
Sabeen A. Altaf, Institute of International Education; Eck Doerry, Northern Arizona University; Larry J. Shuman, University of Pittsburgh; Edward Randolph Collins Jr. P.E., Clemson University
Dean Walton Pichette, Wayne State University; Darin Ellis, Wayne State University; Walter Bryzik, Mechanical Engineering, Wayne State University; Kyoung-Yun Kim, Wayne State University; Ming-Chia D. Lai, Wayne State University; Yun Seon Kim, Wayne State University
Mary Leigh Wolfe, Virginia Tech; Nicholas M Holden, University College Dublin; Demetres Briassoulis, Agricultural University of Athens; Francisco Ayuga, Universidad Politécnica de Madrid, BIPREE Research Group; Giacomo Scarascia Mugnozza, University of Bari, Italy
Ivan G. Guardiola, Missouri University of Science & Technology; Susan L. Murray, Missouri University of Science & Technology; Elizabeth A. Cudney, Missouri University of Science & Technology
Elizabeth A. Cudney, Missouri University of Science & Technology; Steven Michael Corns, Missouri University of Science & Technology; Jennifer A. Farris, Texas Tech University; Stephen Gent, South Dakota State University; Scott E. Grasman, Rochester Institute of Technology (COE); Ivan G. Guardiola, Missouri University of Science & Technology
Heidi A. Taboada, University of Texas, El Paso; Jose F. Espiritu, University of Texas, El Paso; Abril Vazquez, University of Texas, El Paso; Olivia C. Moreno, University of Texas, El Paso
Frankie Santos Laanan, Iowa State University; Balaji Narasimhan, Iowa State University; Monica H. Lamm, Iowa State University; Carlos Lopez, Iowa State University ; Dimitra Lynette Jackson, Iowa State University