Zorica Nedic, University of South Australia; Andrew Nafalski, University of South Australia; Ozdemir Gol, University of South Australia; Jan Machotka, University of South Australia
Adnaan Jiwaji, MIT; James Hardison, MIT; Kayode P. Ayodele, Obafemi Awolowo University, Ile-Ife, Nigeria; Sandy Stevens Tickodri-Togboa, Makerere University; Alfred Mwambela, University of Dar-es-Salaam; V. Judson Harward, MIT; Jesús A. del Alamo, MIT; Bryant Harrison, MIT; Samuel Gikandi, MIT
John M Robertson, Arizona State University, Polytechnic campus; Kathleen Meehan, Virginia Tech; Robert John Bowman, Rochester Institute of Technology (COE); Kenneth A Connor, Rensselaer Polytechnic Institute; Douglas A Mercer, Analog Devices Inc.
Karl L Wang, Department of Engineering Harvey Mudd College 301 Platt Boulevard Clarement, CA 91711 909-607-9136 ; Clint S Cole, Digilent, Inc.; Tinghui Wang, Digilent Inc; Joe Harris, Digilent, Inc.
Patrick Kane, Cypress Semiconductor Corp.; Alexander Ganago, University of Michigan; Robert F. Giles, University of Michigan; Hongwei Liao, University of Michigan, Ann Arbor
Sergey N. Makarov, Worcester Polytechnic Institute; Reinhold Ludwig, Worcester Polytechnic Institute; Kaung Myat Win, Worcester Polytechnic Institute, ECE Department
Vladimir Mitin, University at Buffalo, State University of New York; Nizami Z. Vagidov, University at Buffalo, State University of New York; Athos Chariton Petrou; Xiufeng Liu, University at Buffalo, State University of New York