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Mike Eastman

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Paper listing

Conference Session
TAC/ABET Related Outcome Based Assessment Methods and Models
Collection
2011 ASEE Annual Conference & Exposition
Authors
Ilya Grinberg, Buffalo State College; Ronald E. Land, Pennsylvania State University, New Kensington; Thomas M. Hall Jr., Northwestern State University; Kelly Ann Lacroix, Society of Manufacturing Engineers; Steve Macho, Buffalo State College; Mike Eastman, Rochester Institute of Technology
Conference Session
ETD Design V: Classroom Delivery, Course Content, and Assessments
Collection
2011 ASEE Annual Conference & Exposition
Authors
Mike Eastman, Rochester Institute of Technology; Fred Walker, Rochester Institute of Technology
Conference Session
Emerging Trends in Engineering Education
Collection
2004 Annual Conference
Authors
Richard Cliver; Mike Eastman
Conference Session
Two-Year to Four-Year Transfer Programs: Best Practices
Collection
2016 ASEE Annual Conference & Exposition
Authors
Surendra K. Gupta, Rochester Institute of Technology (COE); James E Moon, Rochester Institute of Technology (COE); Mike Eastman, Rochester Institute of Technology (CAST); Daniel P Johnson, Rochester Institute of Technology (CAST); Todd Dunn, Rochester Institute of Technology (CAST)
Conference Session
Two-year Institutions Help Fill the STEM Pipeline
Collection
2012 ASEE Annual Conference & Exposition
Authors
Surendra K. Gupta, Rochester Institute of Technology; Daniel P. Johnson, Rochester Institute of Technology; John Morelli P.E., Rochester Institute of Technology; Mike Eastman, Rochester Institute of Technology; Vincent Joseph Amuso Sr., Rochester Institute of Technology
Collection
2019 ASEE Zone I Conference & Workshop
Authors
Lisa Greenwood; Mark Indelicato; Miguel Bazdresch; Mike Eastman
Conference Session
An Examination of Methods to Enhance Transfer Student Enrollment, Retenion, Persistence, and Outcomes
Collection
2014 ASEE Annual Conference & Exposition
Authors
Surendra K. Gupta, Rochester Institute of Technology (COE); Daniel P. Johnson, Rochester Institute of Technology (CAST); Mike Eastman, Rochester Institute of Technology (CAST); Vincent Joseph Amuso Sr., Rochester Institute of Technology; John Morelli, Rochester Institute of Technology (CAST)