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Ludovic V. Grivault
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Paper listing
Permanent URL
https://peer.asee.org/authors/71280
Co-authors:
Daryl G. Beetner
Matthew J. Gualdoni
Testing the Susceptibility of a High-Speed Integrated Circuit
Collection
2012 ASEE Midwest Section Conference
Authors
Ludovic V. Grivault
; Matthew J. Gualdoni; Daryl G. Beetner
