Canan Bilen-Green, North Dakota State University; Cinzia Cervato, Iowa State University of Science and Technology; Adrienne Minerick, Michigan Technological University; Ann Burnett, North Dakota State University; Roger Green, North Dakota State University; Carla Koretsky; David Wahl, Iowa State University of Science and Technology; Lori Wingate, Western Michigan University; D. Raj Raman, Iowa State University of Science and Technology; Sonia Goltz; Patricia Sotirin
Sharon Mason; Margaret Bailey, Rochester Institute of Technology (CET); Carol Marchetti, Rochester Institute of Technology (CET); Elizabeth Dell, Rochester Institute of Technology (CET); Maureen Valentine, Rochester Institute of Technology (CET)
Lalita Oka, California State University, Fresno; Kimberly Stillmaker, California State University, Fresno; Sue Rosser; Arezoo Sadrinezhad; Maryam Nazari, California State University, Los Angeles; Younghee Park; Kira Abercromby, California Polytechnic State University, San Luis Obispo; Feruza Amirkulova
Sylvia Mendez, University of Colorado at Colorado Springs; Kathryn Watson, University of Colorado at Colorado Springs; Valerie Conley, University of Colorado at Colorado Springs
WIED: Partnering with and Supporting the WIED Community
Collection
2022 ASEE Annual Conference & Exposition
Authors
Adam Maltese, Indiana University-Bloomington; Kelli Paul, Indiana University-Bloomington; Jungsun Kim, Indiana University-Bloomington; Allison Godwin, Purdue University at West Lafayette (COE); Andrew Katz, Virginia Polytechnic Institute and State University; Amanda Diekman
Ilknur Aydin; Mary Villani, State University of New York, College of Technology at Farmingdale; Lisa Cullington, State University of New York, College of Technology at Farmingdale
Canan Bilen-Green, North Dakota State University; Cali Anicha, North Dakota State University; Brianna Blaser, University of Washington; Sheryl Burgstahler; Cecilia Aragon, University of Washington; Teresa Shume, North Dakota State University
WIED: Partnering with and Supporting the WIED Community
Collection
2022 ASEE Annual Conference & Exposition
Authors
Carol Marchetti, Rochester Institute of Technology (COE); Margaret Bailey, Rochester Institute of Technology (COE); Iris Rivero; Jessica Bennett; Gloria Blackwell
Kathryn Redmond, University of Nebraska - Lincoln; Grace Panther, University of Nebraska - Lincoln; Mojdeh Asadollahipajouh; Rick Evans, Cornell University; Stacey Kulesza, Kansas State University; Grace Liang