Mukasa E. Ssemakula, Wayne State University; Celestine Chukwuemeka Aguwa, Wayne State University; Darin Ellis, Wayne State University; Kyoung-Yun Kim, Wayne State University; Gene Liao, Wayne State University; Shlomo S. Sawilowsky, Wayne State University
Karen Wosczyna-Birch, CT College of Technology and the Regional Center for Next Generation Manufacturing; Wesley Francillon; Robert W. Simoneau, Keene State College
FPD I: Attacking the Problems of Retention in the First Year
Collection
2011 ASEE Annual Conference & Exposition
Authors
Yvette Pearson Weatherton, University of Texas, Arlington; Andrew P. Kruzic, University of Texas, Arlington; Beth R. Isbell, University of Texas at Arlington; Lynn L. Peterson, University of Texas, Arlington; Carter Tiernan, University of Texas, Arlington; Vu V. Pham, University of Texas at Arlington
Valana L. Wells, Arizona State University; Jenefer Husman, Arizona State University; Praveen Shankar, Arizona State University; Wen-Ting Chung, Arizona State University