Frank Kowalski, Colorado School of Mines; Julia Williams, Rose-Hulman Institute of Technology; Rob Reed, Hewlett-Packard Corporation; Jim Vanides, Hewlett-Packard
Andreas Spanias, Arizona State University; Karthikeyan Ramamurthy, Arizona State University; Jayaraman Jayaraman, Arizona State University; Mahesh Banavar, Arizona State University; CHIH-WEI HUANG, Arizona State University
Amy Craig, North Carolina State University; Lisa Bullard, North Carolina State University; Jeff Joines, North Carolina State University; Tom Miller, North Carolina State University; Carolyn Miller, North Carolina State University; Dianne Raubenheimer; George Rouskas, North Carolina State University; Larry Silverberg, North Carolina State University; Eric Wiebe, North Carolina State University
Manuel Castro, Universidad Nacional de Educacion a Distancia; Africa Lopez-Rey, Universidad Nacional de Educacion a Distancia; juan peire, Universidad Nacional de Educacion a Distancia; Julio Freijeiro, Universidad Nacional de Educacion a Distancia
Frank Tuffner, University of Wyoming; Andrew Catellier, University of Wyoming; Robert Kubichek, University of Wyoming; John Pierre, University of Wyoming
Steven Barrett, University of Wyoming; Chad Hager, University of Wyoming; Mike Yurkoski, University of Wyoming; Robert Lewis, University of Wyoming; Matthew Jespersen, University of Wyoming; Zachary Ruble, University of Wyoming
Michael Auer, Carinthia University of Applied Sciences, Austria; A.Y. Al-Zoubi, Princess Sumaya University for Technology; Danilo Garbi Zutin, Carinthia University of Applied Sciences, Austria
Patrick Jarvis, University of St. Thomas; Jeff Jalkio, University of St. Thomas; Marty Johnston, University of St. Thomas; Christopher Greene, University of St. Thomas; Mari Heltne, University of St. Thomas