Erik Wilhelm, Paul Scherrer Institut; Irene Berry, Massachusetts Institute of Technology; Mathew Stevens, University of Waterloo; Warren Schenler, Paul Scherrer Institut
Wei Zheng, Jackson State University; HuiRu Shih, Jackson State University; Karen Lozano, University of Texas-Pan American; Karl Kiefer, Invocon, Inc., Houston, Taxes; Xinqing Ma, Inframat Corp, Farmington, Connecticut.
Mitchell Nathan, University of Wisconsin - Madison; Natalie Tran, University of Wisconsin - Madison; Allen Phelps, University of Wisconsin - Madison; Amy Prevost, University of Wisconsin - Madison
Gisele Ragusa, University of Southern California; Michael Khoo, University of Southern California; Ellis Meng, University of Southern California; Joseph Cocozza, University of Southern California
Jeffrey Fong, National Institute of Standards and Technology; James Filliben, National Institute of Standards and Technology; Alan Heckert, National Institute of Standards and Technology; Roland deWit, National Institute of Standards and Technology
Juanita Jo Matkins, College of William and Mary; John A. McLaughlin, McLauglin Associates; Eugene Brown, Virginia Polytechnic Institute and State University; Gail Hardinge, College of William and Mary; Nancy West, College of William and Mary; Robert Stiegler, Naval Surface Warfare Center, Dahlgren Division; Kirk Jenne, Office of Naval Research
Gregg Janowski, University of Alabama at Birmingham; Melinda Lalor, University of Alabama at Birmingham; Hassan Moore, University of Alabama at Birmingham
Stephanie Goldberg, Buffalo State College; Paul Siciliano, Buffalo State College; Clark Greene, Buffalo State College; Steve Macho, Buffalo State College