Rob O. Hovsapian, Florida State Univeristy ; Chiang Shih, Florida A&M University/Florida State University; Bruce A. Harvey, Florida A&M University/Florida State University, College of Engineering; Okenwa I. Okoli, Florida A&M University/Florida State University
Mark G. Thompson, Kettering University; Craig J. Hoff, Kettering University; James Gover, Kettering University; Allan R. Taylor, Kettering University; Michelle R. Pomeroy, Kettering University; Kevin (Hua) Bai, Kettering Univ
Peter J. Shull, Pennsylvania State University, Altoona; Carla Firetto, The Pennyslvania State University; L.J. Passmore, Pennsylvania State University, Altoona
Lynne A. Slivovsky, California Polytechnic State University, San Luis Obispo; James M. Widmann, California Polytechnic State University, San Luis Obispo; Brian P. Self, California Polytechnic State University, San Luis Obispo; J.Kevin Taylor, California Polytechnic State University, San Luis Obispo
Kathleen Meehan, Virginia Tech; Robert W. Hendricks, Virginia Tech; Cortney V. Martin, Virginia Tech; Peter Doolittle, Virginia Tech; Richadr Lee Clark, Virginia Western Community College
Richard Chiou, Drexel University; Yalcin Ertekin, Drexel University, Engineering Technology; Michael G Mauk P.E., Drexel University; Robin Kizirian, Drexel University
Jeffery S. Thomas, Missouri University of Science & Technology; Richard H. Hall, Missouri University of Science & Technology; Timothy A. Philpot, Missouri University of Science & Technology; Douglas R. Carroll, Missouri University of Science & Technology
David Jan Cowan, Indiana University Purdue University, Indianapolis; Craig Greene, College of the North Atlantic; Modibo Boubacar Traore, Purdue University, School of Engineering and Technology; Wanda L. Worley, Indiana University Purdue University, Indianapolis; Tarawut Boonlua, Mahasarakham University
Brent Nuttall, California Polytechnic State University; Jill Nelson P.E., California Polytechnic State University, San Luis Obispo; Allen C. Estes, California Polytechnic State University
Karen Wosczyna-Birch, CT College of Technology and the Regional Center for Next Generation Manufacturing; Wesley Francillon; Robert W. Simoneau, Keene State College