Amy S. Van Epps, Purdue University, West Lafayette; Iryna Ashby, Purdue University, West Lafayette; Colin M. Gray, Purdue University, West Lafayette; Marisa Exter, Purdue University, West Lafayette
Priya Manohar, Robert Morris University; Sushil Acharya, Robert Morris University; Peter Y. Wu, Robert Morris University; Ali A. Ansari, Virginia State University; Walter W. Schilling Jr., Milwaukee School of Engineering
Frank Vahid, University of California - Riverside; Alex Daniel Edgcomb, Zybooks; Bailey Alan Miller, Zyante Inc.; Tony Givargis, University of California - Irvine
Huihui H Wang, Jacksonville University; Lee Ann Jerome Clements, Jacksonville University; Cindy Leong; Misha M. Chalkley; Crandall Maines, Jacksonville University
S. Gary Teng, University of North Carolina-Charlotte; Ertunga Ozelkan, University of North Carolina-Charlotte; Yesim Sireli, University of North Carolina-Charlotte; Karen Elmore, University of North Carolina-Charlotte
Nada Marie Anid, New York Institute of Technology; Steven H. Billis, New York Institute of Technology; Marta Alicia Panero, New York Institute of Technology
Tzu-Liang Bill Tseng, University of Texas, El Paso; Richard Chiou, Drexel University (Eng.); Paras Mandal, University of Texas, El Paso; Carlos Alejandro Garcia; Natalia V Espino, UTEP; Zhonghua Hu; David Ricardo Romo; Monica I. Corella, University of Texas, El Paso
Richard H. Crawford, University of Texas, Austin; Christina Kay White, University of Texas, Austin; Chandra L. Muller, University of Texas, Austin; Anthony J. Petrosino Jr., University of Texas, Austin ; Austin B. Talley P.E., University of Texas, Austin ; Kristin L. Wood, University of Texas, Austin
Linda S. Hirsch, New Jersey Institute of Technology; Suzanne L. Berliner-Heyman, New Jersey Institute of Technology; John D. Carpinelli, New Jersey Institute of Technology; Howard S. Kimmel, New Jersey Institute of Technology