Methods, Techniques, and New Programs in Graduate Education
Collection
2011 ASEE Annual Conference & Exposition
Authors
Michele L. Strutz, Purdue University, West Lafayette; James Edwin Cawthorne Jr., Purdue University, West Lafayette; Daniel Michael Ferguson, Purdue University, West Lafayette; Mark T. Carnes, Purdue University, West Lafayette; Matthew W. Ohland, Purdue University, West Lafayette
TAC/ABET Related Outcome Based Assessment Methods and Models
Collection
2011 ASEE Annual Conference & Exposition
Authors
Ilya Grinberg, Buffalo State College; Ronald E. Land, Pennsylvania State University, New Kensington; Thomas M. Hall Jr., Northwestern State University; Kelly Ann Lacroix, Society of Manufacturing Engineers; Steve Macho, Buffalo State College; Mike Eastman, Rochester Institute of Technology
TAC/ABET Related Outcome Based Assessment Methods and Models
Collection
2011 ASEE Annual Conference & Exposition
Authors
Richard Cliver, Rochester Institute of Technology (CAST); William M. Leonard, Rochester Institute of Technology; Elizabeth Dell, Rochester Institute of Technology; Robert A. Merrill, Rochester Institute of Technology
Christine Valle, Georgia Institute of Technology; Sue Rosser, San Francisco State University; Janet H Murray, Georgia Tech; Wendy C. Newstetter, Georgia Institute of Technology; John D. Leonard II, Georgia Institute of Technology; Laurence J. Jacobs, Georgia Institute of Technology
Mark Anthony Shreve, North Carolina State University; Theodore J. Branoff, North Carolina State University; Eric N. Wiebe, North Carolina State University; Jeremy V. Ernst, North Carolina State University
Carl Greco, Arkansas Tech University; James D. Reasoner Jr, Arkansas Tech University; Daniel Bullock, Arkansas Tech University; Carlos L. Castillo, Arkansas Tech University; Patricia S. Buford, Arkansas Tech University; Gill G. richards, Arkansas Tech University
Narayanan M. Komerath, Georgia Institute of Technology; Marilyn Smith, Georgia Institute of Technology; Brian German, Georgia Institute of Technology; Dolores S. Krausche, Florida Center for Engineering Education; Erian A. Armanios, University of Texas, Arlington
Patrick Kane, University of New Hampshire and Cypress Semiconductor; Thadeus Paul Kochanski, Vital Electronics Institute; Andrzej Rucinski, University of New Hampshire
Seokyoung Ahn, University of Texas - Pan American; Robert A. Freeman, University of Texas, Pan American; Stephen W. Crown, University of Texas, Pan American; Gregory Allen Potter, The University of Texas - Pan American
Jim M. Papadopoulos, University of Wisconsin - Stout; Christopher Papadopoulos, University of Puerto Rico, Mayaguez Campus; Vincent C. Prantil, Milwaukee School of Engineering