vahid salehi pour mehr, Florida International University; Ali Mazloomzadeh, Florida International University; Osama A. Mohammed, Florida International University; Juan Francisco Fernandez, Florida International University; Javier Parra
Saeed Sean Monemi, California State Polytechnic University, Pomona; Nipun M. Patel; Jesse Gurr; Yee Cheung Tsang; Christopher John Bolton; Bryon Scott Watkins
Mark G. Thompson, Kettering University; Craig J. Hoff, Kettering University; James Gover, Kettering University; Allan R. Taylor, Kettering University; Michelle R. Pomeroy, Kettering University; Kevin (Hua) Bai, Kettering Univ
Jinru Liu, School of ECEE, SenSIP Center, Arizona State University; Jayaraman J. Thiagarajan, Arizona State University; Andreas S. Spanias, Arizona State University, School of ECEE, SenSIP Center; Karthikeyan Natesan Ramamurthy, Arizona State University; Shuang Hu, Arizona State University; Mahesh K. Banavar, Arizona State University
Lynne A. Slivovsky, California Polytechnic State University, San Luis Obispo; James M. Widmann, California Polytechnic State University, San Luis Obispo; Brian P. Self, California Polytechnic State University, San Luis Obispo; J.Kevin Taylor, California Polytechnic State University, San Luis Obispo
Kathleen Meehan, Virginia Tech; Robert W. Hendricks, Virginia Tech; Cortney V. Martin, Virginia Tech; Peter Doolittle, Virginia Tech; Richadr Lee Clark, Virginia Western Community College
Paul G. Flikkema, Northern Arizona University; Kenji Ryan Yamamoto, Northern Arizona University; Carol Haden, Magnolia Consulting, LLC; Jeff Frolik, University of Vermont; Tom Weller, University of South Florida
Mihaela Radu, Rose-Hulman Institute of Technology; Clint S. Cole, Digilent, Inc.; Joe Harris, Digilent, Inc.; Mircea Dabacan, Technical University of Cluj-Napoca
Dale S.L. Dolan, California Polytechnic State University; Vladimir I. Prodanov, California Polytechnic State University, San Luis Obispo; Taufik Taufik, California Polytechnic State University
David Jakob Fritz, Oklahoma State University; Wira Mulia, Oklahoma State University; Sohum Sohoni, Oklahoma State University; Kerri S. Kearney, Oklahoma State University; Mwarumba Mwavita, Oklahoma State University
Kenneth A. Connor, Rensselaer Polytechnic Institute; Frederick C Berry, Milwaukee School of Engineering; Mohamed F. Chouikha, Howard University; Dianna Newman, University at Albany/SUNY; Meghan Morris Deyoe, The Evaluation Consortium; Gavin Anaya; William Brubaker, Rensselaer Polytechnic Institute
Patrick Kane, Cypress Semiconductor Corp.; Alexander Ganago, University of Michigan; Robert F. Giles, University of Michigan; Hongwei Liao, University of Michigan, Ann Arbor