It's All About the Student: Integration, Problem Solving, Critical Thinking, and Self-Efficacy
Collection
2019 ASEE Annual Conference & Exposition
Authors
Mary Katherine Watson, The Citadel; William J. Davis P.E., The Citadel; Timothy W. Mays, The Citadel; Ronald W. Welch P.E., The Citadel; John C. Ryan, The Citadel
It's All About the Student: Integration, Problem Solving, Critical Thinking, and Self-Efficacy
Collection
2019 ASEE Annual Conference & Exposition
Authors
Maelle van Thienen, University of Auckland, New Zealand; Pablo Garcia, Xorro Solutions Ltd; Wyatt Banker-Hix P.E., California Polytechnic University, San Luis Obispo; Anahid Behrouzi, California Polytechnic State University, San Luis Obispo; James Boon Piang Lim, University of Auckland
It's All About the Student: Integration, Problem Solving, Critical Thinking, and Self-Efficacy
Collection
2019 ASEE Annual Conference & Exposition
Authors
Sean Lyle Gestson, Oregon State University; Shane A. Brown P.E., Oregon State University; Matthew Stephen Barner, Oregon State University; Masoud Ghodrat Abadi, California State University, Sacramento; David S. Hurwitz, Oregon State University
Understanding Students' Narratives of Grand Challenges Scholars Program as a Nexus Between Liberal and STEM Education
Collection
2019 ASEE Annual Conference & Exposition
Authors
Yevgeniya V. Zastavker, Franklin W. Olin College of Engineering; Abigail M Fry, Olin College of Engineering; Holly Nguyen; Gretchen Rice, Olin College; Sydney Ross, Lawrence Technological University; Sebastien Zenzo Selarque, Rochester Institute of Technology (CET); Bridgit Spies; Margarite Vaccaro; Jason Barrett, Lawrence Technological University; Sarah Aileen Brownell, Rochester Institute of Technology; Matthew Marshall, Rochester Institute of Technology (COE); Karen Kashmanian Oates, Worcester Polytechnic Institute; David I. Spanagel, Worcester Polytechnic Institute; James J. Winebrake, Rochester Institute of Technology; Alison Wood, Franklin W. Olin College of Engineering
Targeted Harassment in Engineering Education: What It Looks Like, Why Now, and What Is at Stake
Collection
2019 ASEE Annual Conference & Exposition
Authors
Alice L Pawley, Purdue University-Main Campus, West Lafayette (College of Engineering); Erin A. Cech, University of Michigan; Donna M Riley, Purdue University-Main Campus, West Lafayette (College of Engineering); Stephanie Farrell, Rowan University
Susannah Howe, Smith College; Robin Ott, Virginia Tech; Marie C. Paretti, Virginia Tech; Cristian Hernandez; Jessica Deters, Virginia Tech; Chris Gewirtz, Virginia Tech; Francesca Giardine, Smith College; Anne Kary, Smith College
Robert P. Loweth, University of Michigan; Shanna R. Daly, University of Michigan; Kathleen H. Sienko, University of Michigan; Amy Hortop, University of Michigan; Elizabeth Ann Strehl, University of Michigan
Giovanna Scalone, University of Washington; Aaron Justin Joya, University of Washington; Kathryn Elizabeth Shroyer, University of Washington; Cynthia J. Atman, University of Washington
Eric Reynolds Brubaker, Stanford University; Vikas Rammohan Maturi, Stanford University; Barbara A. Karanian, Stanford University; Sheri Sheppard, Stanford University; David Beach, Stanford University
Elisabeth Kames, Florida Institute of Technology ; Devanshi Shah, Florida Institute of Technology; McKenzie Carol Clark; Beshoy Morkos, Florida Institute of Technology
Michael A. Gennert, Worcester Polytechnic Institute; Nima Lotfi, Southern Illinois University, Edwardsville; James A. Mynderse, Lawrence Technological University; Monique Jethwani; Vikram Kapila, NYU’s Tandon School of Engineering
Julian Ly Davis, University of Southern Indiana; Tom McDonald, University of Southern Indiana; Bradley Lane Kicklighter, University of Southern Indiana
Rhonda Kay Gaede, University of Alabama, Huntsville; Thomas Morris, University of Alabama, Huntsville; Rishabh Das; Yu Lei; Thiago Alves, University of Alabama, Huntsville ; Hongyu Zhou, University of Alabama, Huntsville; Farbod Fahimi, University of Alabama, Huntsville
Samuel Aaron Snyder, Virginia Tech; Desen Sevi Özkan, Virginia Tech; Diana Bairaktarova, Virginia Tech; Thomas W. Staley, Virginia Tech; Stephen Biscotte, Virginia Tech
Ahmed Cherif Megri, North Carolina A&T State University; Sameer Hamoush P.E., North Carolina A&T State University; Rachid Belmasrour, Southern University at New Orleans; Gwen Lee-Thomas, Quality Measures