James L. Ellingson, University of Saint Thomas; Christopher S. Greene, University of Saint Thomas; Scott Edward Morgan; Miguel Angelo Rodrigues Silvestre, University of Beira Interior
joshua fabian, Villanova University; Tyler A. Young, Villanova University; James Peyton Jones, Villanova University; Garrett Miles Clayton, Villanova University
Kenneth A. Connor, Rensselaer Polytechnic Institute; Dianna L. Newman, University at Albany/SUNY; Meghan Morris Deyoe, University at Albany/SUNY; Craig J. Scott, Morgan State University; Mohamed F. Chouikha, Howard University; Yacob Astatke, Morgan State University
ABET Accreditation, Assessment, and Program Improvement in ECE
Collection
2012 ASEE Annual Conference & Exposition
Authors
Larry L Wear, University of Washington, Tacoma; Orlando R. Baiocchi, University of Washington, Tacoma; Matthew Alden, University of Washington, Tacoma; Robert Gutmann, University of Washington, Tacoma; Jie Sheng, University of Washington, Tacoma
Mircea Alexandru Dabacan, Technical University of Cluj-Napoca; Clint S. Cole, Digilent, Inc.; Mihaela Radu, Rose-Hulman Institute of Technology; Joe Harris, Digilent, Inc.; Alex DUPE Wong; Monica Bot
Aharon Gero, Technion - Israel Institute of Technology; Wishah Zoabi, Technion – Israel Institute of Technology; Nissim Sabag, Ort Braude College of Engineering
Seyed Hossein Mousavinezhad, Idaho State University; Paul J. Benkeser, Georgia Institute of Technology; Pamela Bhatti, Georgia Institute of Technology; Burton Dicht, IEEE; Douglas Gorham, IEEE; Chris Macnab, University of Calgary; Sadiq Mitchell, IEEE; Cherrice Traver, Union College; Stephen M. Williams P.E., Milwaukee School of Engineering; Loren Wyard-Scott, University of Alberta