Paul G. Flikkema, Northern Arizona University; Kenji Ryan Yamamoto, Northern Arizona University; Carol Haden, Magnolia Consulting, LLC; Jeff Frolik, University of Vermont; Tom Weller, University of South Florida
Mihaela Radu, Rose-Hulman Institute of Technology; Clint S. Cole, Digilent, Inc.; Joe Harris, Digilent, Inc.; Mircea Dabacan, Technical University of Cluj-Napoca
Dale S.L. Dolan, California Polytechnic State University; Vladimir I. Prodanov, California Polytechnic State University, San Luis Obispo; Taufik Taufik, California Polytechnic State University
David Jakob Fritz, Oklahoma State University; Wira Mulia, Oklahoma State University; Sohum Sohoni, Oklahoma State University; Kerri S. Kearney, Oklahoma State University; Mwarumba Mwavita, Oklahoma State University
Kenneth A. Connor, Rensselaer Polytechnic Institute; Frederick C Berry, Milwaukee School of Engineering; Mohamed F. Chouikha, Howard University; Dianna Newman, University at Albany/SUNY; Meghan Morris Deyoe, The Evaluation Consortium; Gavin Anaya; William Brubaker, Rensselaer Polytechnic Institute
Patrick Kane, Cypress Semiconductor Corp.; Alexander Ganago, University of Michigan; Robert F. Giles, University of Michigan; Hongwei Liao, University of Michigan, Ann Arbor
Anurag K. Srivastava, Washington State University; Soumya K. Srivastava, Washington State University; Adrienne R. Minerick, Michigan Technological University; Noel N. Schulz, Kansas State University
Tumkor Serdar, Stevens Institute of Technology; El-Sayed Aziz, Stevens Institute of Technology; Sven K. Esche, Stevens Institute of Technology; Constantin Chassapis, Stevens Institute of Technology (School of Engineering and Science)
Xingguo Xiong, University of Bridgeport; Linfeng Zhang, University of Bridgeport; Lawrence V. Hmurcik, University of Bridgeport; Navarun Gupta, University of Bridgeport
Sergey N. Makarov, Worcester Polytechnic Institute; Reinhold Ludwig, Worcester Polytechnic Institute; Kaung Myat Win, Worcester Polytechnic Institute, ECE Department