Sanjay Raman, Virginia Polytechnic Institute and State University; Da Silva Luiz, Virginia Polytechnic Institute and State University; Masoud Agah, Virginia Polytechnic Institute and State University; Allen MacKenzie, Virginia Polytechnic Institute and State University; Christopher Maxey, Virginia Polytechnic Institute and State University; Amy Bell, Virginia Polytechnic Institute and State University
J. Craig Prather, Auburn University; Haley Kay Harrell, Auburn University; Lesley Erin Bartlett, Auburn University; Stuart M. Wentworth, Auburn University
Kenneth A. Connor, Rensselaer Polytechnic Institute; Dianna Newman, University at Albany/SUNY; Kathy Ann Gullie Ph.D., Evaluation Consortium University at Albany/SUNY; Yacob Astatke, Morgan State University; Charles J. Kim, Howard University; John Okyere Attia P.E., Prairie View A&M University; Petru Andrei, Florida A&M University/Florida State University; Mandoye Ndoye, Tuskegee University
Ronald F. DeMara, University of Central Florida; Navid Khoshavi, University of Central Florida; Steven D. Pyle, University of Central Florida; John Edison, University of Central Florida; Richard Hartshorne, University of Central Florida; Baiyun Chen, University of Central Florida; Michael Georgiopoulos, University of Central Florida; Ronald F. DeMara, University of Central Florida
Jenny E.G. Porch; Ryan Michael Coyne, University of Maryland, Eastern Shore; Lei Zhang, University of Maryland, Eastern Shore; Ibibia K. Dabipi, University of Maryland, Eastern Shore
John Crofton, Murray State University; James Rogers, Murray State University; Caitlin Pugh, University of Kentucky; Kenny Evans, University of Kentucky
Ali Mazloomzadeh, Florida International University; Mustafa Farhadi, Florida International University; Osama A. Mohammed, Florida International University
Jia-Ling Lin, University of Minnesota, Twin Cities; Paul Imbertson, University of Minnesota, Twin Cities; Tamara J Moore, University of Minnesota, Twin Cities
Margret Hjalmarson, George Mason University; Jill K Nelson, George Mason University; Lisa G. Huettel, Duke University; Wayne T. Padgett, Rose-Hulman Institute of Technology; Kathleen E. Wage, George Mason University; John R. Buck, University of Massachusetts, Dartmouth
Mircea Alexandru Dabacan, Technical University of Cluj-Napoca; Clint S. Cole, Digilent, Inc.; Mihaela Radu, Rose-Hulman Institute of Technology; Joe Harris, Digilent, Inc.; Alex DUPE Wong; Monica Bot
Seyed Hossein Mousavinezhad, Idaho State University; Paul J. Benkeser, Georgia Institute of Technology; Pamela Bhatti, Georgia Institute of Technology; Burton Dicht, IEEE; Douglas Gorham, IEEE; Chris Macnab, University of Calgary; Sadiq Mitchell, IEEE; Cherrice Traver, Union College; Stephen M. Williams P.E., Milwaukee School of Engineering; Loren Wyard-Scott, University of Alberta
Kenneth A. Connor, Rensselaer Polytechnic Institute; Dianna L. Newman, University at Albany/SUNY; Meghan Morris Deyoe, University at Albany/SUNY; Craig J. Scott, Morgan State University; Mohamed F. Chouikha, Howard University; Yacob Astatke, Morgan State University
Craig J. Scott, Morgan State University; Petronella A. James, Morgan State University; Yacob Astatke, Morgan State University; Jumoke O. Ladeji-Osias, Morgan State University
Bosco Mansel Oliver, Clemson University; John R. Wagner, Clemson University; Elham B. Makram, Clemson University; Rajendra DUPE Singh, Clemson University