ABET Accreditation, Assessment and Program Improvement in ECE.
Collection
2013 ASEE Annual Conference & Exposition
Authors
Diane T. Rover, Iowa State University; Douglas W. Jacobson, Iowa State University; Ahmed E. Kamal, Iowa State University; Akhilesh Tyagi, Iowa State University
John M Robertson, Arizona State University, Polytechnic campus; Kathleen Meehan, Virginia Tech; Robert John Bowman, Rochester Institute of Technology (COE); Kenneth A Connor, Rensselaer Polytechnic Institute; Douglas A Mercer, Analog Devices Inc.
Karl L Wang, Department of Engineering Harvey Mudd College 301 Platt Boulevard Clarement, CA 91711 909-607-9136 ; Clint S Cole, Digilent, Inc.; Tinghui Wang, Digilent Inc; Joe Harris, Digilent, Inc.
Dale N. Buechler, University of Wisconsin, Platteville; Phil J Sealy Jr., University of Wisconsin, Platteville; John R Goomey, University of Wisconsin, Platteville
Ali Mazloomzadeh, Florida International University; Mustafa Farhadi, Florida International University; Osama A. Mohammed, Florida International University
Jia-Ling Lin, University of Minnesota, Twin Cities; Paul Imbertson, University of Minnesota, Twin Cities; Tamara J Moore, University of Minnesota, Twin Cities
Stanley W. Hsu, University of California, Davis; Rajeevan Amirtharajah, University of California, Davis; andre knoesen, Department of Electrical and Computer Engineering, U C Davis
Margret Hjalmarson, George Mason University; Jill K Nelson, George Mason University; Lisa G. Huettel, Duke University; Wayne T. Padgett, Rose-Hulman Institute of Technology; Kathleen E. Wage, George Mason University; John R. Buck, University of Massachusetts, Dartmouth