John J. Duffy, University of Massachusetts, Lowell; Linda Barrington, University of Massachusetts, Lowell; Manuel A Heredia, University of Massachusetts, Lowell
Christopher W. Swan, Tufts University; Kurt Paterson, Michigan Technological University; Olga Pierrakos, James Madison University; Angela R. Bielefeldt, University of Colorado, Boulder; Bradley A. Striebig, James Madison University
Kathleen Meehan, Virginia Tech; Robert W. Hendricks, Virginia Tech; Cortney V. Martin, Virginia Tech; Peter Doolittle, Virginia Tech; Justeen Olinger, Virginia Tech
Matthew W. Roberts, University of Wisconsin, Platteville; Philip J. Parker, University of Wisconsin, Platteville; Michael K. Thompson, University of Wisconsin, Platteville; Barb A. Barnet, Univeristy of Wisconsin - Platteville
Tzu-Liang Bill Tseng, University of Texas, El Paso; Rong Pan, Arizona State University; Jun Zheng, University of Texas, El Paso; Carolyn Joy Awalt, University of Texas, El Paso, College of Education; Maria Veronica Gonzalez, University of Texas, El Paso; Francisco Medina
Patrick A. Tebbe, Minnesota State University, Mankato; Nicholas Saucedo, Minnesota State University, Mankato; Jeffrey Richard Pribyl, Minnesota State University, Mankato; Stewart L. Ross, Minnesota State University, Mankato
Stephanie Elizabeth August, Loyola Marymount University; Allison Neyer, Department of Electrical Engineering and Computer Science; Don Brian Murphy, Loyola Marymount University; Robert Quinlan Thames
Steven W. Villachica, Boise State University; Donald Plumlee, Boise State University; Linda Huglin, Boise State University; Drew Borresen, Boise State University
Rebecca K. Toghiani, Mississippi State University; Adrienne R. Minerick, Michigan Technological University; Keisha B. Walters, Mississippi State University; Priscilla J. Hill, Mississippi State University; Carlen Henington, Mississippi State University
David L. Soldan, Kansas State University; Noel N. Schulz, Kansas State University; Blythe A. Vogt, Kansas State University; Don Gruenbacher, Kansas State University; Rekha Natarajan, Kansas State University
Yi Guo, Stevens Institute of Technology; Shubo Zhang, Stevens Institute of Technology; Hong Man, Stevens Institute of Technology; Arthur B. Ritter, Stevens Institute of Technology
Ashley Ater Kranov, Washington State University; Mo Zhang, Washington State University; Steven W. Beyerlein, University of Idaho, Moscow; Jay McCormack, University of Idaho; Patrick D. Pedrow, Washington State University; Edwin R. Schmeckpeper, Norwich University
Steve Warren, Kansas State University; Xiongjie Dong, Kansas State University; Tim J. Sobering, Kansas State University; Jason Yao, East Carolina University