Steve Naumov, Purdue University Calumet; William Obermeyer, Purdue University Calumet; Rahul Singhal, Purdue University Calumet; Eduardo Garcia, Purdue University Calumet; Nasser Houshangi, Purdue University Calumet
Yu-Wei Huang, National Changhua University of Education; Jieh-Shian Young, National Changhua University of Education; Chih-Hung Wu, Chienkuo Technology University; Hsing-Jung Li, National Chung Cheng University
William Graff, LeTourneau University; Paul R. Leiffer, LeTourneau University; Matthew G. Green, LeTourneau University; Joel Koblich, LeTourneau University
Mohammad N. Amin, National University; Ronald P. Uhlig, National University; Pradip Peter Dey, National University; Bhaskar Raj Sinha, National University
Esther Ososanya, University of the District of Columbia; Samuel Lakeou, University of the District of Columbia; Wagdy Mahmoud, University of the District of Columbia; Amarachukwu C Ukaegbu, University of the District of Columbia; Lily Kemathe, University of the District of Columbia
Seunghyun Chun, University of Texas, Austin, Department of Electrical and Computer Engineering; Bruce McCann, University of Texas, Austin; Ariane L. Beck, University of Texas, Austin; Eric Dean, National Instruments; Alexis Kwasinski, University of Texas at Austin
Laboratories in Electrical and Computer Engineering Technology
Collection
2009 Annual Conference & Exposition
Authors
Cheng Lin, Old Dominion University; Gene Hou, Old Dominion University; Sebastian Bawab, Old Dominion University; Timothy Coats, NSWCCD; Hesham Nassar, Old Dominion University
Laboratories in Electrical and Computer Engineering Technology
Collection
2009 Annual Conference & Exposition
Authors
Arif Uluagac, Georgia Institute of Technology; Walter E. Thain Jr.; Thomas Fallon, Southern Polytechnic State University; John Copeland, Georgia Institute of Technology
Electrical and Computer Engineering Laboratory and SoC Developments
Collection
2022 ASEE Annual Conference & Exposition
Authors
Andrea Schuman, Virginia Polytechnic Institute and State University; Lisa McNair, Virginia Polytechnic Institute and State University; Thomas Martin, Virginia Polytechnic Institute and State University; Justin Kleiber, Virginia Polytechnic Institute and State University